1st Gatan Asian EELS School 2012
Gatan Asian EELS School 2012
Dec 3-7 2012 (3.5 days school)
Research Center for Ultra-High Voltage Electron Microscopy, Osaka University
Transmission electron microscopy (TEM) reveals details of natural and man-made structures at the micrometer, nanometer, and even sub-nanometer scale. Energy-filtered TEM (EFTEM) and electron energy-loss spectroscopy (EELS) are the ideal analytical partners to the high spatial resolution provided by TEM in both the conventional and scanned (STEM) imaging modes.
In order to increase our support to the Asian scientific community, in collaboration with Osaka University, Gatan is organizing the first Gatan Asian EELS School in Osaka, Japan from December 3rd to 7th 2012. This school is open to all researchers in Asia and Oceania. Interested people from other regions may also contact the organizer and join the school if places are available
This course reviews the basic theory and practice of EELS imaging and analysis in the TEM, but its main emphasis is on practical techniques, optimum deployment of Gatan hardware and software systems, and advanced EELS and EFTEM applications. Some prior experience with EELS, EFTEM, and Gatan systems is recommended, as is a good familiarity with TEM/STEM instrumentation and techniques. By the end of the course, participants can expect to know how best to optimize the performance of their Gatan EELS hardware as well as their EELS and EFTEM experimental setups in order to capture and extract the maximum amount of information from their TEM samples.
Equipment used: JEOL JEM-ARM200F equipped with Quantum ER, STEM, DualEELS and 64 bits system.
School Organizer: Alan Maigne
School fee: $650.00 US Dollars including course materials and lunches
INFORMATION AND REGISTRATION: for information and registration click here. The course is limited to 24 participants