646 Double Tilt Analytical Holder

The 646 Double Tilt Analytical Holder incorporates design features optimized for electron diffraction and EDS analysis of crystalline TEM specimens.  

Key Features

Analytical design

• Specimen cradle, Hexring® and Anti-twist washer are made of beryllium for analytical applications

ToggleTilt™ beta drive mechanism

• Robust operation with no mechanical binding of the specimen cradle at tilt limits

• Maximum +/- 30° using TEM control

• Maximum +/- 45° using Accutroller

Reduced Shadowing

• Optimized for EDS analysis

Faraday Cup

• Quantitative measurement of the incident electron beam current  

Tilt ranges and compatibility of specimen holders vary according to the TEM manufacturer, model, pole piece gap, and the presence of in-gap accessories.  Please contact your local Gatan representative for more information.



ToggleTilt™ beta drive mechanism