Library

New broad ion beam (BIB) processing steps for 3D SEM investigation of heterogeneous solids (W. Hauffe et al), click here
3D Microscopy and Microanalysis of heterogeneous SEM samples by broad ion beam processing: cutting-etching-coating (W. Hauffe et al), click here
Advances in broad ion beam processing for 3D microscopy and microanalysis of ceramic composites (W. Hauffe et al), click here
3D microscopy and microanalysis of Au-Al ultrasonic bonds by specific ion beam processing steps and scanning electron microscopy (W. Hauffe et al), click here
Ion beam preparation procedures for three-dimensional SEM resolved Kikuchi (EBSD) and Kossel microdiffraction analysis of deformed metals (W. Hauffe et al), click here
Broad ion beam grid cutting with Gatan PECS for 3D scanning electron microscopy and microanalysis of integrated circuits and layered structures (W. Hauffe et al), click here
Advantages of broad ion beam (BIB) processing compared with focused ion beam (FIB) technology for 3D investigation of heterogeneous solids. (W. Hauffe et al), click here
Combined ion beam preparation procedures for simultaneous investigation of surface and bulk properties by SEM (W. Hauffe et al), click here
New applications of the Gatan PECS ion beam cutting tool for 3D SEM microstructure investigation of heterogeneous solids (W. Hauffe et al), click here
Gatan PECS Slope Cut application of a layer system on Ni-based superalloy (metal/ceramic) (W. Hauffe et al), click here
Application Note: PECS Slope Cutting of Cast Iron (R. Mitro), click here
Poster 1. Ion Beam Etching of Metal Composites using Gatan's PECS (I. Gräf), click here
Poster 2. Applications of Ion Beam Slope Cutting with Gatan's PECS (W. Hauffe), click here