Scanning transmission electron microscopy (STEM)
imaging can provide structural and compositional information
over nanometer and sub-nanometer scales. The Gatan
805 BF/DF STEM detector can be used in bright field
(BF) or dark field (DF) modes. Advantages of the detector
include ultra-low noise performance, high sensitivity
and on-axis installation allowing simultaneous DF
imaging and electron energy-loss spectroscopy (EELS).
The detector position (BF, DF or fully retracted)
is pneumatically controlled. The detector position
is aligned to be the optic axis of GIF or Enfina and
is ideal for spectrum imaging and manual EELS experiments.
The electron signal is converted to light using a
thick YAG scintillator that operates up to 400kV.
The light signal is coupled using a light pipe to
a photomultiplier tube (PMT). The PMT and preamplifier
are contained in a shield that minimizes the effect
of electromagnetic interference. The response of system
is linear over standard STEM operating conditions.
The bandwidth of the preamplifier can be optimized
for pulse counting.
The 805 BF/DF STEM detector is the ideal partner
to any GIF or Enfina system.