2019 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics

The 2019 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics (FCMN) will bring together scientists and engineers interested in all aspects of the characterization technology needed for nanoelectronic materials and device research, development, and manufacturing. All approaches are welcome: chemical, physical, electrical, magnetic, optical, in-situ, and real-time control and monitoring. The conference will summarize major issues and provided critical reviews of important semiconductor techniques needed as the semiconductor industry moves to silicon nanoelectronics and beyond. The conference consists of formal invited presentation sessions and poster sessions for contributed papers. The poster papers cover new developments in characterization and metrology especially at the nanoscale. The conference series began 1995 and is the 12th conference in the series.

Gatan is a corporate sponsor and exhibitor of FCMN 2019. We specialize in materials research and development for electron microscopy and our products are used in a broad range of advanced applications, including: metrological structures, nano-materials, semiconductors (micro- and nano-electronics), and optoelectronics. We will have a team of R&D engineers and sales managers at the conference to discuss your application needs. Please visit the Gatan sponsor table or contact Matt Chipman if you would like to schedule a specific time to meet with us. We look forward to meeting you at FCMN.

Gatan Electronics

Tuesday, April 2, 2019 to Thursday, April 4, 2019
8:00 am - 5:00 pm
Monterey Marriott Hotel
350 Calle Principal
93940 Monterey , CA
United States
California US