27th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis

ESREF 2016, the 27th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis continues to focus on recent developments and future directions in quality, robustness and reliability research of materials, components, integrated electronic circuits/systems and their nano-, micro-, power-, optoelectronics devices. ESREF provides the leading European forum for developing all aspects of reliability management and failure prevention for present and future electronics. ESREF 2016 will have a specific focus on reliability issues in automotive electronics.

Gatan is an exhibitor and sponsor of ESREF 2016. Please visit us and speak with our R&D and sales representatives about your application needs for both TEM and SEM or email us at info@gatan.com.

Monday, September 19, 2016 to Thursday, September 22, 2016
8:00 am - 5:00 pm
Händel-Halle, Halle (Saale)
Germany