Advanced EM School on Aberration-Corrected Microscopy and EELS

This training school organized by the Canadian Centre for Electron Microscopy will focus on advanced training with instructors and expert users of aberration-corrected microscopes, electron optics (correctors and microscopes) and spectrometers. The school will cover advanced electron energy loss spectroscopy (EELS) acquisition methods on the GIF Quantum®, Tridiem® and FS1 spectrometers, monochromator alignments, advanced EELS data processing, multivariate statistical methods, advanced STEM image data processing and energy loss near-edge structures (ELNES) computation methods. This school boast very satisfied high-level students and, also very importantly, very pleased supervisors for the quality of the interactions and learning directly with experts in the operation and alignments of the microscopes.

Register

Monday, June 1, 2015 to Friday, June 5, 2015
8:00 am - 6:00 pm
McMaster University
1280 Main Street West
L8S4L8 Hamilton , ON
Canada
Ontario CA