Advances in In-Situ Microscopy Workshop

Addressing In-Situ TEM Challenges Using Integrated Hardware and Software

With the advent of faster data transfer and processing capabilities, it is now possible to record and manage large datasets in situ. You can store each pixel in each frame directly to disk, and treat them as an individual image. Alternatively, you can apply various algorithms or scripts post-capture to quantify the stimulus applied to the system. This greatly enhances the flexibility of data management and gives you previously unseen resolution in time and space to resolve reactions that previously were unknown.

This intensive workshop sponsored by Gatan, JEOL, Oxford, and DENSsolutions at Drexel University, will present and demonstrate state-of-the-art instruments and software for in-situ electron microscopy applications. Lectures and hands-on lab sessions will show how a complete in-situ system can optimize data management and reveal critical details in reaction processes. Specifically, temperature-induced transitions in both complex oxide materials and 2-dimensional MXene will be studied. Chemical and electronic transitions will be measured with direct detection electron energy loss spectroscopy (EELS) and correlated with the sample IV behavior. The in-situ system on a JEOL JEM 2100F STEM will feature:

Workshop Program

All presentations will be held in the Mitchell Auditorium, Bossone Research Center, first floor. Demonstrations will be held in the Centralized Research Facilities, Bossone Research Center, first floor.

8:00 – 9:00 a.m. Welcome and registration (breakfast provided)
9:00 – 9:30 a.m.
Direct detection electron energy loss spectroscopy: Opportunities and challenges for in-situ microscopy
Mitra Taheri, Drexel University
9:30 – 10:00 a.m. Addressing in-situ TEM challenges using integrated hardware and software
Ben Miller, Gatan
10:00 – 10:30 a.m. Hybrid transmission electron microscope: An integrated platform for in-situ imaging and spectroscopies
Renu Sharma, National Institutes of Standards & Technology
10:30 – 10:45 a.m. Coffee break
10:45 – 11:15 a.m. Phonon spectroscopy and mapping in nanostructures
Phil Batson, Rutgers University
11:15 – 11:45 a.m. New frontiers in cryo-electron microscopy: From probing low temperature electronic phases to processes at liquid/solid interfaces
Lena Kourkoutis, Cornell University
11:45 a.m. – 12:15 p.m. In-situ EELS characterization at high spatial resolution: 2D materials based liquid-cell microscopy
Robert Klie, University of Illinois-Chicago
12:15  – 1:00 p.m. Lunch (provided)
1:00 – 5:00 p.m. Hands-on JEOL JEM 2100F STEM demonstrations of in-situ experiments coupled with direct detection EELS.


The workshop is complimentary to all confirmed registrants. Space is limited. Please register by October 2, 2017. For more information about the workshop, please contact Danielle Elswick, Gatan.

Register        Program

Wednesday, October 4, 2017
8:00 am - 5:00 pm
Drexel University
3140 Market St
19104 Philadelphia , PA
United States