EBSD 2016

EBSD 2016 is the 5th topical conference of the Microanalysis Society (MAS) in a series on electron backscattered diffraction (EBSD). This is the first year it will be held at the University of Alabama. EBSD 2016 will be an opportunity for all practitioners of EBSD, from newcomers to seasoned professionals, to learn about the latest technical advances and share their research results. The first day is dedicated to a detailed overview tutorial that covers the principles and practice of EBSD and includes hands-on sessions for new users as well as EBSD vendor demos for registered attendees. Subsequent days will consist of invited and contributed talks as well as a contributed poster session. 

Gatan is a major sponsor of EBSD 2016. We will have a demonstration table in the conference center and will be featuring our new fully automated broad argon beam tool on a scanning electron microscope (SEM) or focused ion beam (FIB) system that produces large planar polished surfaces with minimal surface damage for 3D EBSD and EDS analysis. We design and manufacture a complete portfolio of EM products and software for EBSD analysis. Please visit the Gatan table to discuss your application needs with our R&D and sales representatives.

Tuesday, May 24, 2016 to Thursday, May 26, 2016
8:00 am - 5:00 pm
University of Alabama
245 7th Avenue, 360 H.M. Comer Hall
35487 Tuscaloosa , AL
United States