Gatan Nippon Technology Seminar 2016

Advances in Techniques and Instrumentation for Electron Microscopy

You are invited to attend this user seminar at the TKP Tokyo Otemachi Conference Center on January 29, 2016. This is a unique opportunity to engage with top investigators and Gatan R&D engineers in a broad range of TEM and SEM technologies. They will be presenting innovations and current trends in TEM and SEM specimen preparation, holders, imaging systems, analytical instruments, and software.

Program

9:30 – 10:00
Registration
10:00 – 10:05
Introduction
K. Takauchi (Nippon Gatan)
10:05 – 10:55
Gatan Microscopy Suite (GMS) 3: Ease of use, high productivity and optimal results
Dr. J. Wilbrink (Senior Vice President, Software, Gatan Inc.)
10:55 – 11:35
Spectrum imaging techniques using GMS 3 software
K. Inoke (Nippon Gatan)
11:35 – 12:15
3D analysis using SBF-SEM and ion milling
H. Fujitani (Nippon Gatan)
12:15 – 13:15
Lunch
13:15 – 14:00
Current and future trends in volume imaging using SBF-SEM
Prof. Ohno (Yamanashi University)
14:00 – 14:45
Analysis of battery materials using Cs-STEM by Toyota
Dr. T. Shiotsuki (Toyota)
14:45 – 15:00
Break
15:00 – 15:45
Direct electron detector brings evolution to electron cryo-microscopy
Dr. Shigematsu (Riken)
15:45 – 16:35
Direct detection cameras and holders for in-situ electron microscopy: trade-offs and emerging opportunities
Dr. S. Mick (Product Manager, In-situ, Gatan Inc.)
16:35 – 16:45
Questions and answers
16:45 – 16:50
Closing remarks
17:00 – 19:00
Social celebration

For questions, please contact Nippon Gatan: +81 3 5639 2772; nippongatan@gatan.com

Register              Program

Friday, January 29, 2016
9:30 am - 7:00 pm
TKP Tokyo Otemachi Conference Center
1-8-1,Otemachi
100-0004 Chiyoda-ku , 13
Japan