International Symposium for Testing and Failure Analysis 2016

What is 10,000 times faster than a FIB?

Find out at ISTFA 2016 in Gatan booth 208. We would like to introduce you to the new microPREP™ system that is a fast, clean, and efficient laser ablation system for SEM, TEM, and FIB specimen preparation. Learn how this high throughput system shortens your time to prepare samples of metal, semiconductor, ceramic, and compound materials for microstructure characterization or failure analysis.

  • Cross section bulk samples within minutes, not days or months
  • Combine with FIB to increase your throughput for large lamella preparation

We will have our R&D engineers and sales managers available to discuss your electron microscopy sample preparation applications.

Gatan, Inc. is the world's leading manufacturer of instrumentation and software used to enhance and extend the operation and performance of electron microscopes. Gatan products, which are fully compatible with nearly all electron microscope models, cover the entire range of the research process—from specimen preparation and manipulation to imaging and failure analysis.



Sunday, November 6, 2016 to Thursday, November 10, 2016
9:00 am - 6:00 pm
Fort Worth Convention Center
201 Houston Street
76102 Fort Worth , TX
United States