International Symposium for Testing and Failure Analysis 2018

The theme of the International Symposium for Testing and Failure Analysis (ISTFA) 2018 Meeting is "Failures Worth Analyzing."

While technology advances fast and the market demands the latest and the greatest, successful companies strive to stay competitive and remain profitable. Some have moved their factories to low-cost centers and many outsource IC fabrication to external foundries which makes Failure Analysis (FA) more challenging. Is it time to rethink failure analysis strategy to reduce cost? Should we identify the most efficient workflow and equipment for hard failures vs. soft failures or systematic failures vs. random failures? How about designing a workflow that focuses on high return, high-value failure analysis to maximize return on FA investments?

Gatan continues to be a corporate sponsor and exhibitor of ISTFA. For ISTFA 2018, we will feature our new Solarus® II, the next-generation plasma tool to remove hydrocarbon contamination from TEM and SEM samples and holders. Please visit booth 314 and discuss your FA applications with us. We will have a team of R&D engineers and sales managers to show you our broad range of TEM and SEM FA-specific instruments and software. We hope to see you in Phoenix.

Sunday, October 28, 2018 to Thursday, November 1, 2018
8:00 am - 5:00 pm
Phoenix Convention Center
100 N 3rd Street
85004 Phoenix , AZ
United States