ISTFA 2017

The International Symposium for Testing and Failure Analysis (ISTFA) offers the best venue to failure analysts for acquiring the knowledge and resources needed to take on these challenges. At ISTFA, you can learn from experts about the tools and techniques needed for maximizing success rate in every aspect of electronic device failure analysis process. You can network with other failure analysts who can offer critical technical advice, and you will learn about state-of-art tools to meet your analysis challenges at the exposition. You can also participate as an expert presenter, teaching your novel idea or technique to the FA community. The theme of ISTFA 2017 is Striving for 100% Success Rate.

Gatan is a long-standing sponsor and exhibitor of ISTFA. We will have a full team of R&D engineers and sales managers to discuss your failure analysis applications. Our electron microscopy instruments and software specific for failure analysis can help you perform faster preparation of your metal, semiconductor, ceramic, and compound material samples to achieve your best results. Please visit Gatan booth 815 or contact Mike Coy to schedule an appointment during exhibit hours. We hope to see in Pasadena.

Failure Analysis

Sunday, November 5, 2017 to Thursday, November 9, 2017
8:00 am - 5:00 pm
Pasadena Convention Center
300 E Green Street
91101 Pasadena , CA
United States