JEOL F2 and Gatan: The new world for in-situ applications

This course will highlight the newest in-situ product and application solutions from JEOL and Gatan in the field of material science. It will feature a wide range of topics, including basic introductions to the newest TEM and camera technologies, examples of unique applications, live demonstrations, and the newest results from leading researchers.

Seating is limited, so register early.

Register

Agenda

09:00 – 09:30 Registration
09:30 – 09:40 Welcome and introduction
JEOL and Gatan
09:40 – 10:15 The JEM-F200 – JEOL's new multipurpose analytical TEM
JEOL
10:15 – 10:45 Digital imaging in the TEM
Ana Pakzad, Gatan
10:45 – 11:00 Break
11:00 – 11:30 Invited speaker
Dr. Marc Willinger, FHI Berlin
11:30 – 12:00 Invited speaker
Dr. -Ing. Venkata Sai Kiran Chakravadhanula, KIT Karlsruhe
12:00 – 13:00 Lunch
13:00 – 13:30 Live remote demonstration: JEM-F200
JEOL
13:30 – 14:00 Overview: In-situ capabilities
Ana Pakzad, Gatan
14:00 – 14:30 Live demonstration: In-situ TEM using high speed cameras
Ana Pakzad, Gatan
14:30 – 14:45 Break
14:45 – 16:00 Live demonstration: Optimized in-situ experiments using OneView® IS and DENSsolutions in-situ systems
Ana Pakzad, Gatan
16:00 – 16:30 Tour of the demo lab / Closing remarks
JEOL and Gatan
Thursday, October 20, 2016
9:30 am - 4:30 pm
JEOL GmbH
Gute Änger 30
85356 Freising
Germany