Microscopy Characterisation of Organic-Inorganic Interfaces Conference 2019

This specialized technical meeting is dedicated to microscopy of materials comprised of both organic and inorganic constituents (in close proximity) and is aimed at bringing together experts from both the life science and materials science communities to address this challenging and increasingly important topic. The 2019 Focus Lecture Series is dedicated to "Advances in imaging beam sensitive materials in the transmission electron microscope” and is co-organized by Prof. Dr. Rafal E. Dunin-Borkowski, Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons, Forschungszentrum Jülich, Germany. The Focus lectures will cover topics that include the use of novel imaging modes in both TEM and scanning TEM to image electron beam sensitive materials, as well as computational approaches for extracting quantitative information from both images and diffraction patterns.

Gatan is a corporate sponsor and exhibitor of the 2019 Microscopy Characterisation of Organic-Inorganic Interfaces Conference. We invite you to the Gatan Techno-bite Talk at 18:05 on March 7. We will present our industry-leading direct detection technology for beam-sensitive materials characterization. If you would like to discuss your application challenges imaging and analyzing beam-sensitive samples, please visit the Gatan exhibit stand or contact Dr. Merlin Mueller to schedule a meeting during the conference. We hope to see you at Harnack-Haus.

Thursday, March 7, 2019 to Friday, March 8, 2019
8:00 am - 5:00 pm
Ihnestrasse 16-20
14195 Berlin