PICO 2019: Frontiers of Aberration Corrected Electron Microscopy

PICO 2019, the 5th conference on Frontiers of Aberration Corrected Electron Microscopy will address recent advances in methods and applications for the study of structural and electronic properties of condensed matter by the application of advanced transmission electron microscopy techniques in solid state research and the life sciences. Topical issues of advanced electron microscopy research will be highlighted in keynote presentations given by leading invited speakers plus further poster presentations from the wider scientific community. Forty-five oral keynote presentations and poster sessions will create the ideal forum for interaction amongst the 150 delegates and invited thought leaders.

Gatan is a corporate sponsor and exhibitor of PICO 2019. We invite you to the Gatan lecture on advanced detector systems for electron energy loss spectroscopy (EELS) and energy-filtered transmission electron microscopy (EFTEM) systems. Please visit the Gatan exhibit stand or contact Dr. Merlin Mueller to schedule a meeting during the conference. We hope to see you at PICO 2019.

Monday, May 6, 2019 to Friday, May 10, 2019
8:00 am - 5:00 pm
Kasteel Vaalsbroek
Vaalsbroek 1
6291 NH Vaals
Netherlands