Sample Preparation to 3D Analysis Workshop

Gatan, Tescan, and Oxford Instruments invite you to attend this comprehensive, full-day workshop that demonstrates the complete EM workflow for materials characterization. Presentations and demonstrations will cover the latest technologies for sample preparation, through imaging and 3D analysis; as well as highlight in-situ and FIB-SEM material characterization techniques.

Two dates are available to attend this one-day workshop. Seating is limited, so register early.

Program      Registration

Note: All presentations will be delivered in Czech.
Tuesday, December 6, 2016 to Wednesday, December 7, 2016
8:30 am - 5:00 pm
Centrum výzkumu Řež s.r.o.
Hlavní 130, 250 68 Husinec-Řež
Czech Republic