Southeastern Microscopy Society 2017 Meeting

Groundbreaking MOF Results: Gatan K2 Summit Reveals the Surface and Interfacial Structures of MOF ZIF-8

Do you work with electron beam sensitive materials such as metal-organic framework (MOF) structures? Join us at the Southeastern Microscopy Society (SEMS) 2017 Meeting to discover how the K2 direct detection camera is advantageous to measure beam sensitive MOFs. With the extraordinary ability to capture individual electrons under extremely low illumination conditions, the K2 can acquire high-resolution images of MOF ZIF-8 with an unprecedented resolution that reveal the atomic structures of the material’s bulk, surface, and interfacial areas (dx.doi.org/10.1038/nmat4852).

Visit the Gatan sponsor booth or contact James Long to schedule an appointment to discuss these groundbreaking MOF results and the K2 camera's ability to capture TEM images with an unprecedented resolution. We will be available to discuss how cryo-electron microscopyserial block-face imagingin-situ, electron energy loss spectroscopy, and sample preparation technologies can help you better understand biological structures and design more efficient materials.

We hope to see you at SEMS.

Groundbreaking MOF Results

Tuesday, May 23, 2017 to Friday, May 26, 2017
8:00 am - 5:00 pm
Holiday Inn Athens-University Area
197 East Broad Street
30601 Athens , GA
United States