Stanford imaging workshop: Advanced applications of high speed imaging in S/TEM

Stanford Nano Shared Facilities (SNSF) and Gatan, Inc. invite you to attend this unique S/TEM workshop demonstrating the latest high speed imaging technology and applications specifically for in-situ TEM and 4D STEM diffraction.

This comprehensive, full-day workshop will feature lectures by leading experts, open Q&A sessions, and live microscope demonstrations all in the state-of-the-art SNSF research complex. The microscope sessions will be performed on an aberration (image) corrected, monochromated FEI Titan environmental (S)TEM with a Gatan OneView in-situ camera (winner of the 2015 Microscopy Today Innovation Award at M&M 2015).

This workshop is complimentary to all registered and confirmed participants and includes breakfast, lunch and refreshments. Seating is limited.


8:30  9:00 a.m. Registration (sign-in required) and breakfast
9:00  9:15 a.m. Introduction to SNSF and workshop overview
Dr. Tobi Beetz, Stanford University and Dr. Ana Pakzad, Gatan
9:15 – 10:00 a.m.

Digital imaging in TEM
Dr. Ana Pakzad, Gatan

10:00 – 10:45 a.m.

In-situ TEM techniques
Dr. Ai Leen Koh, Stanford University

10:45 – 11:00 a.m. Break
11:00 a.m. – 12:30 p.m.

Lab: In-situ TEM using high speed camera

12:30 – 1:30 p.m. Lunch
1:30 – 2:15 p.m. Electron diffraction in S/TEM
Dr. Ann Marshall, Stanford University
2:15 – 3:00 p.m. Applications of high speed direct electron detectors in 4D STEM experiments including strain mapping, diffraction imaging, PACBED and phase contrast STEM
Dr. Colin Ophus, NCEM
3:00 – 3:15 p.m. Break
3:15 – 4:45 p.m. Lab: 4D STEM diffraction using high speed camera
4:45 – 5:00 p.m. Open forum and closing remarks

For details on the program and workshop sessions, please contact Dr. Ana Pakzad, Gatan or Dr. Ai Leen Koh, Stanford University.

Registration        Parking & Maps

Friday, March 11, 2016
8:30 am - 5:00 pm
Stanford University
Stanford Nano Shared Facilities
94305-4088 Stanford , CA
United States