Webinar: Understanding Deformation & Failure Mechanisms via Electron Microscopy

Mechanical deformation and failure processes such as fatigue crack formation and ductile fracture are inherently multiscale processes, ranging from nanoscale crack nucleation mechanisms to collective dislocation interactions ranging across hundreds of microns. Understanding these processes requires multiscale characterization approaches that reflect the nature of the processes. Advances in electron detector technology, including the advent of direct-electron detectors, and increases in computational processing capacity have transformed electron microscopy-based characterization into a big-data analytics tool capable of multimodal image acquisition and high-resolution property mapping. This includes the ability to post-experiment select desired imaging conditions and map out the three-dimensional elastic strain tensor, crystal rotations, and dislocation density at length scales ranging from nanometers to hundreds of microns. Increases in electron detection efficiency available from direct-electron detectors also allows multimodal image acquisition to be coupled with in situ electron microscopy experiments such as heating, straining, and exposure to aggressive environments, giving us new insight into nano and mesoscale deformation processes.

In this webinar, Josh Kacher, from Georgia Tech, will discuss the work his group is doing in applying advanced multiscale and multimodal electron-microscopy based characterization techniques to understand mechanical deformation and failure processes. He will focus his results on two materials applications: understanding the influence of second phase particles in ductile failure of Al alloys and determining the role of processing conditions in strain localization during cyclic loading of additive manufactured alloys.

Presenter

Josh Katcher, Assistant Professor, Georgia Tech College of Engineering

Register Today

Wednesday, June 12, 2019
8:00 am - 9:00 am