Gatan’s 3View Capability Extends High Throughput 3D Imaging to JEOL Field Emission Scanning Electron Microscopes

Posted: 
October 24, 2013

Abingdon, UK, 21st October 2013:

Today, a joint initiative between JEOL and Gatan is announced which brings the power of Serial Block Face SEM (SBFSEM) to the JEOL family of scanning electron microscopes. JEOL is a world leader in the field of electron microscopy and, with the integration of Gatan's 3View2.XP system, will now promote the technique of SBFSEM on its JSM-7100F Field Emission Scanning Electron Microscope.

Takeshi Nokuo, General Manager of the JEOL Ltd. SM business unit comments, “We are happy to announce that integration of the two instruments has taken place at Gatan's Abingdon, UK facility where a new demonstration suite has been opened to demonstrate the full capability of the combined tool to researchers working on their own specimens. Gatan’s high performance 3View2.XP and low kV backscattered electron detector coupled to JEOL’s high brightness and highly stable SEM platform will increase the overall throughput and reliability of the entire system.”

"This cooperation between JEOL and Gatan will allow researchers to image a wide range of 3D structures at nanometer resolution,” says Christopher Booth, Life Science Product Manager at Gatan Inc. “It is now possible to automatically collect a dataset in a matter of days that would otherwise take many months or even years using the traditional method of serial section imaging in the TEM.”

Benjamin Wood, acting President of Gatan Inc., said, "This initiative firmly establishes Gatan Inc. as a leader in 3D electron microscopy.  We are pleased this collaboration will give JEOL’s large and diverse customer base access to this truly remarkable new technology.”
 

              

About JEOL Ltd.

JEOL Ltd. is a world leader in electron optical equipment and instrumentation for high-end scientific and industrial research and development. Core product groups include electron microscope s (SEMs and TEMs), instruments for the semiconductor industry (electron beam lithography and a series of defect review and inspection tools), and analytical instruments including mass spectrometers, NMRs and ESRs. For more information on JEOL Ltd. visit: www.jeol.co.jp/en/   

 

About Gatan Inc.

Gatan, Inc. is the world's leading manufacturer of instrumentation and software used to enhance and extend the operation and performance of electron microscopes. Gatan's products, which are fully compatible with all brands of electron microscopes, cover the entire range of the scientific instrumentation from specimen preparation and manipulation to imaging and analysis. The Gatan brand name is recognized and respected throughout the worldwide scientific community and has been synonymous with high quality products and the industry's leading technology. For more information on Gatan Inc. visit:  www.gatan.com

Press Contact

Jennifer McKie
+1.925.224.7350 
jmckie@gatan.com