The team at Electron Microscopy Group in Nano-Materials Research Institute of AIST aims to realize the characterization of...
Electron energy loss spectroscopy (EELS) is a family of techniques that measure the change in kinetic energy of electrons after they interact with a specimen. This technique is used to determine the atomic structure and chemical properties of a specimen, including the type and quantity of atoms present, chemical state of atoms and the collective interactions of atoms with their neighbors. Some of these techniques include spectroscopy, energy-filtered transmission electron microscopy (EFTEM), and DualEELS™.
As electrons pass through a specimen, they interact with atoms of the solid. Many of the electrons pass through the thin sample without losing energy. A fraction will undergo inelastic scattering and lose energy as they interact with the specimen. This leaves the sample in an excited state. The material can de-excite by giving up energy typically in the form of visible photons, x-rays or Auger electrons.
As the incident electron interacts with the sample, it changes both its energy and momentum. You can detect this scattered incident electron in the spectrometer as it gives rise to the electron energy loss signal. The sample electron (or collective excitation) carries away this additional energy and momentum.
Core-loss excitations occur when tightly bound core electrons are promoted to a higher energy state by the incident electron. The core electron can only be promoted to an energy that is an empty state in the material. These empty sates can be bound states in the material above the Fermi level (so-called anti-bonding orbitals in the molecular orbital picture). The states can also be free-electron states above the vacuum level. It is the sudden turn-on of the scattering at the Fermi energy and the probing of empty states which makes the EELS signal sensitive to both the atom type and its electronic state.
You can visualize the initial spectral features in the core-loss excitations when you align the Fermi level with the zero-loss peak (ZLP) of the spectrum. The edges can now be seen as the point where the electrons lose enough energy to promote the core level atomic electrons to the Fermi level. This analogy fails to reproduce the scattering above the Fermi level but is helpful to visualize the core level edge sudden increase in intensity.
A typical energy loss spectrum includes several regions. The first peak, the most intense for a very thin specimen, occurs at 0 eV loss (equal to the primary beam energy) and is therefore called the zero-loss peak. It represents electrons that did not undergo inelastic scattering but may have been scattered elastically or with an energy loss too small to measure. The width of the zero-loss peak mainly reflects the energy distribution of the electron source. It is typically 0.2 – 2.0 eV but may be as narrow as 10 meV or lower in a monochromated electron source.
For more information on the EELS family of techniques, please visit EELS.info, an educational site.
DigitalMicrograph, also known as Gatan Microscopy Suite, drives your digital cameras and surrounding components to support key applications including tomography, in-situ, spectrum and diffraction imaging, plus more.
Electron counting for all your EELS, EFTEM, and energy-filtered 4D STEM applications.
A powerful method of obtaining detailed analytic data from a sample on an electron microscope equipped with scanning mode.
Digital beam control and image processing to enhance the photographic quality of your digital images.
Simulation tool to eliminate the guesswork from your EELS and EFTEM compositional mapping experiments.
High-angle annular dark field (HAADF), annular dark field (ADF) plus bright and dark field (BF/DF) detectors for STEM imaging optimized for electron energy loss spectroscopy (EELS).
The most intuitive and easy-to-use analytical tool for (scanning) transmission electron microscope (STEM) applications.
Quantify microstructural changes in materials due to applied mechanical loading.
The EELS and EFTEM systems ideal for multiuser facilities, now with the Stela hybrid-pixel option.
The best-in-class imaging filter for cryo-EM is now available with EELS and EFTEM.
The Ringe Group was established in 2014 in the department of Materials Science and NanoEngineering (MSNE) at Rice University, Houston...
- Extremely dose efficient EELS spectrum image acquisition with Gatan eaSI technology
- GIF Continuum K3 IS: Advanced Direct Detection for In-Situ Chemical Analysis
- Capturing, Processing, and Synchronizing In-Situ EELS Data
- Continuum IS: Versatile time-resolved data collection webinar
- Continuously acquired 4D STEM and EELS spectrum images for in-situ microscopy webinar
- DualEELS: The importance of low-loss correction of electron energy-loss spectroscopy data
- Understanding electronic correlations in quantum materials
- Multimodal spectrum imaging at low kV with GIF Continuum K3 with Stela
- High-Speed Counting EELS at low kV with GIF Continuum K3 with Stela
- NLLS for ELNES example
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Akita, T.; Tabuchi, M.; Nabeshima, Y.; Tatsumi, K.; Kohyama, M.
Reduction and immobilization of hexavalent chromium by microbially reduced Fe-bearing clay materials
Bishop, M. E.; Glasser, P.; Dong, H.; Arey, B. W.; Kovarik, L.
Seeing and measuring in colours: Electron microscopy and spectroscopies applied to nano-optics
Kociak, M,; Stéphan, O.; Gloter, A.; Zagonel, L. F.; Tizei, L. H. G.; Tencé, M.; March, K.; Blazit, J. D.; Mahfoud, Z.; Losquin, A.; Meuret, S.; Colliex, C.
Watanabe, S.; Kinoshita, M.; Hosokawa, T.; Morigaki, K.; Nakura, K.
Fe and Mn oxidation states by TEM-EELS in fine-particle emissions from a Fe-Mn alloy making plant.
Marris, H.; Deboudt, K.; Flament, P.; Grobéty, B.; Gieré, R.
Kitta, M.; Akita, T.; Tanaka, S.; Kohyama, M.
Atomic scale real-space mapping of holes in YBa2Cu3O6+δ
Gauquelin, N.; Hawthorn, D. G.; Sawatzky, G. A.; Liang, R. X.; Bonn, D. A.; Hardy, W. N.; Botton, G. A.
Häussler, D.; Houben, L.; Essig, S.; Kurttepeli, M.; Dimroth, F.; Dunin-Borkowski, R. E.
Sánchez-Santolino, G.; Tornos, J.; Bruno, F. Y.; Cuellar, F. A.; Leon, C.; Santamaría, J.; Pennycook, S. J.; Varela, M.
Klimenkov M.; Möslang A.; Materna-Morris, E.
Evolution of order in amorphous-to-crystalline phase transformation of MgF2
Mu, X.; Neelamraju, S.; Sigle, W.; Koch, C. T.; Totò, N.; Schön, J. C.; Bach, A.; Fischer, D.; Jansen, M.; van Aken, P. A.
Aberration-corrected and energy filtered precession electron diffraction
Eggeman, A. S.; Barnard, J. S.; Midgley, P. A.
Seeing the atoms more clearly: STEM imaging from the Crewe era to today
Pennycook, S. J.
Reduction of nickel oxide particles by hydrogen studied in an environmental TEM
Jeangros, Q.; Hansen, T. W.; Wagner, J. B.; Damsgaard, C. D.; Dunin-Borkowski, R. E.; Hébert, C.; Van herle, J.; Hessler-Wyser, A.
Fast STEM spectrum imaging using simultaneous EELS and EDS
Longo, P.; Twesten, R.
Tracking lithium transport and electrochemical reactions in nanoparticles
Wang, F.; Yu, H. C.; Chen, M. H.; Wu, L.; Pereira, N.; Thornton, K.; Van der Ven, A.; Zhu, Y.; Amatucci, G. G.; Graetz, J.
STEM characterization for lithium-ion battery cathode materials
Huang, R.; Ikuhara, Y.
Subparticle ultrafast spectrum imaging in 4D electron microscopy
Yurtsever, A.; van der Veen, R. M.; Zewail, A. H.
Haruta, M.; Kurashima, K.; Nagai, T.; Komatsu, H.; Shimakawa, Y.; Kurata, H.; Kimoto, K.
Cosandeya, F.; Suc, D.; Sinaa, M.; Pereiraa, N.; Amatuccia, G. G.
Advanced synthesis of materials for intermediate-temperature solid oxide fuel cells
Shao, Z.
Nemcsics, Á.; Heyn, Ch.; Tóth, L.; Dobos, L.; Stemmann, A.; Hansen, W.
Electronic structure of supelattice and twin in Ga doped ZnO measured by monochromated EELS
Chang, H.; Yoon, S.; Seong, T.; Yu, T.; Yuo, Y.; Ahn, J.
Tan, H.; Turner, S.; Yücelen, E.; Verbeeck, J.; Van Tendeloo, G.
Lari, L.; Walther, T.; Gass, M.H.; Geelhaar, L.;Chèze, C.; Riechert, H.; Bullough, T. J.; Chalker, P. R.
Janbroers, S.: Crozierc, P. A.; Zandbergen, H. W.; Kooyman, P. J.
Mapping titanium and tin oxide phases using EELS: An application of independent component analysis
de la Peña, F.; Berger, M. H.; Hochepied, J. F.; Dynys, F.; Stephan, O.; Walls, M.
D-STEM: A parallel electron diffraction technique applied to nanomaterials
Ganesh, K. J.; Kawasaki, M.; Zhou, J. P.; Ferreira, P. J.
Gentle STEM: ADF imaging and EELS at low primary energies
Krivanek, O. L.; Dellby, N.; Murfitt, M. F.; Chisholm, M. F.; Pennycook, T. J.; Suenaga, K.; Nicolosi, V.
van Schooneveld, M. M.; Gloter, A.; Stephan, O.; Zagonel, L. F.; Koole, R.; Meijerink, A.; Mulder W. J. M.; de Groot, F. M. F.
Wu, C. T.; Chu, M. W.; Chen, L. C.; Chen, K. H.; Chen, C. W.; Chen, C. H.
Orientation dependence of shock-induced twinning and substructures in a copper bicrystal
Cao, F.; Beyerlein, I. J.; Addessio, F. L.; Sencer, B. H.; Trujillo, C. P.; Cerreta, E. K.; Gray III, G. T.
Servanton, G.; Pantel, R.
Tanaka, K.; Miwa, T.; Sasaki, K.; Kuroda, K.
Review of recent advances in spectrum imaging and its extension to reciprocal space
Maigne, A.; Twesten, R. D.
Bernier, N.; Brosset, C.; Bocquet, F.; Tsitrone, E.; Saikaly, W.; Khodja, H.; Alimov, V. Kh.; Gunn, J. P.
Four-dimensional STEM-EELS: Enabling nano-scale chemical tomography
Jarausch, K.; Thomas, P.; Leonard, D. N.; Twesten, R.; Booth, C. R.
Yakovlev, S.; Libera, M.
Feldhoff, A.; Arnold, M.; Martynczuk, J.; Gesing, Th. M.; Wang, H.
Yamada, T.; Maigne, A.; Yudasaka, M.; Mizuno, K.; Futaba, D. N.; Yumura, M.; Iijima, S.; Hata, K.
High-angular-resolution electron energy loss spectroscopy of hexagonal boron nitride
Arenal, R.
Heterogeneity of a vulcanized rubber by the formation of ZnS clusters
Dohi, H.; Horiuchi, S.
Fe speciation in geopolymers with Si/Al molar ratio of ∼2
Perera, D. S.; Cashion, J. D.; Blackford, M. G.; Zhang, Z.; Vance, E. R.
Horiuchi, S.; Dohi, H.
Nanoscale analysis of polymer interfaces by energy-filtering transmission electron microscopy
Horiuchi, S.; Yin, D.; Ougizawa, T.
Nanoscale EELS analysis of dielectric function and bandgap properties in GaN and related materials
Borckt, G.; Lakner, H.
Measuring the thickness of aluminium alloy thin foils using electron energy loss spectroscopy
Bardal, A.; Lie, K.
Applications
Posters
Fast STEM EELS spectrum imaging analysis of Pd-Au based catalysts
A quantitative investigation of biological materials using EELS
High-speed composition analysis of high-z metal alloys in DualEELS mode
Fast atomic level EELS mapping analysis using high-energy edges in DualEELS mode
Atomic resolved EELS analysis across interfaces in III-V MOSFET high-k dielectric gate stacks