EMC 2016 - Learning Sessions

Live Demonstrations

Reserve time to see how Gatan’s innovative specimen preparation equipment and state-of-the-art high speed detectors help you push the boundaries of what can be done with electron microscopy. All demonstrations are in the Gatan booth (#31).

DENSsolutions in-situ TEM systems
Capture dynamic structural changes in situ to better understand the structure-property relationship for a full range of heating, biasing, gas, and liquid applications.

  • Leverage unrivaled sample stability to capture the real time dynamics of materials at elevated temperatures
  • Investigate nano-electronic materials and devices under a controllable electrical and thermal environment
  • Observe atomic gas-solid interactions in atmospheric pressure and high temperature environments
  • Image samples in fully-hydrated, static, or flowing conditions

 

OneView® camera
ONE camera to capture high quality 16 megapixel still images AND video in all of your TEM applications.

  • Always have a “live” experience with 25 frames per second at full 4k x 4k resolution
  • Winner of the 2015 Microscopy Today Innovation Award
STEMx™ 4D STEM
Fastest camera-based scanning transmission electron microscope (STEM) diffraction system available.
  • Perform state-of-the-art, high speed STEM diffraction imaging at acquisition rates up to 1600 patterns/s
  • Acquire at the highest frame rate to minimize specimen damage and sample drift, while allowing for the largest scan area possible
  • Exclusive option for the OneView and K2® IS cameras
 
   

Lunch & Learn

Discover how products from Gatan bring you closer to your unique applications. All presentations are in the Gatan booth (#31). Space is limited and lunch will be available.

Monday, 29 August
12:00 – 12:20 OneView: Redefining the TEM imaging experience
12:30 – 12:50 Application of Gatan high speed cameras for 4D data collection in STEM
Tuesday, 30 August
12:30 – 12:50 Low kV backscattered electron imaging with the OnPoint™ BSE detector
Thursday, 1 September
12:00 – 12:20 Optical properties from the micro- to nano-scale: Cathodoluminescence microscopy
12:30 – 12:50 Optimizing STEM spectrum image acquisition for high speed analysis

 

Platform/Posters

We invite you to these Gatan authored/coauthored sessions on key electron microscopy applications and emerging technologies. Please check the scientific program for all final listings.

Monday, 29 August – Tuesday, 30 August
  • New approaches to multidimensional experiments in S/TEM: Application of high speed cameras (IM01-144, Exhibition Hall, Poster Session B)
Wednesday, 31 August
  • Multidimensional analysis of local compositional and valence fluctuations in the model complex oxide La2MnNiO6 (IM8-1, Amphithéâtre)

 

Pre-EMC Training Courses

Thursday, 25 August – Friday, 26 August