Fast EELS analysis of AlNiCo based metal alloy for magnetic purposes
Paolo Longo, Ph.D., Gatan, Inc. Sample courtesy of Dr. Li Zhou at Ames Lab, Iowa

Fast EELS analysis of AlNiCo based metal alloy for magnetic purposes

EELS data taken using a FEI F20 TEM/STEM microscope equipped with S-FEG emission gun and a fully loaded GIF Quantum® ER system.

Methods

Voltage: 200 kV; data taken in STEM mode; EELS spectrum (300 – 2300 eV) exposure time: 8 ms; total exposure time: <1 min