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31 - 40 of 1218 publications
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Optimising electronholography in the presence of partial coherence and instrument instabilities

Ultramicroscopy
2015

Chang, S. L.; Dwyer, C.; Boothroyd, C. B.; Dunin-Borkowski, R. E.

Optimizing disk registration algorithms for nanobeam electron diffraction strain mapping

Ultramicroscopy
2017

Pekin, T. C.; Gammer, C.; Ciston. J.; Minor, A. M.; Ophus, C.

Experimental method for determining Cliff–Lorimer factors in transmission electron microscopy (TEM) utilizing stepped wedge-shaped specimens prepared by focused ion beam (FIB) thinning

Ultramicroscopy
1999

Longo, D. M.; Howe, J. M.; Johnson, W. C.

Thickness and defocus dependence of inter-atomic electric fields measured by scanning diffraction

Ultramicroscopy
2020

Addiego, C.; Gao, W.; Pan, X.

Aberration-corrected transmission electron microscopy analyses of GaAs/Si interfaces in wafer-bonded multi-junction solar cells

Ultramicroscopy
2013

Häussler, D.; Houben, L.; Essig, S.; Kurttepeli, M.; Dimroth, F.; Dunin-Borkowski, R. E.

Diffraction contrast imaging using virtual apertures

Ultramicroscopy
2015

Gammer, C.; Ozdol, V. B.; Liebscher, C. H.; Minor, A. M.

Assessment of the strain depth sensitivity of Moiré sampling scanning transmission electron microscopy geometrical phase analysis through a comparison with dark-field electron holography

Ultramicroscopy
2021

Pofelski, A.; Whabi, V.; Ghanad-Tavakoli, S.; Botton, G.

Modeling of temperature profiles in an environmental transmission electron microscope using computational fluid dynamics

Ultramicroscopy
2014

Mortensen, P. M.; Hansen, T. W.; Wagner, J. B.; Jensen, A. D.

Precise measurement of the electron beam current in a TEM

Ultramicroscopy
2021

Krause, F. F.; Schowalter, M.; Oppermann, O.; Marquardt, D.; Müller-Caspary, K.; Ritz, R.; Simson, M.; Ryll, H.; Huth, M.; Soltau, H.; Rosenauer, A.

Low-dose (S)TEM elemental analysis of water and oxygen uptake in beam sensitive materials

Ultramicroscopy
2019

Leijten, Z. J. W. A.; Wirix, J. M.; Strauss, M.; Plitzko, J. M.; de With, G.; Friedrich, H.

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