2006 Gatan Microscopy Training Schools

As every year during the Spring, the Gatan Inc. R&D Headquarters in Pleasanton, CA, USA prepares itself for large groups of visitors from Asia, Europe, and the US. These visitors are microscopists who have registered for Gatan’s annual Training Schools in TEM Digital Microscopy, EELS Imaging & Analysis, TEM and SEM Specimen Preparation, and In-situ SPM-TEM Nanocharacterization.

These professional training schools offer microscopists extensive and comprehensive education and laboratory training on the latest specimen preparation, imaging, and analysis techniques and technologies. The instructors are highly trained and experienced scientists and experts in their fields. Each school offers a unique, interactive curriculum combining both classroom teaching and laboratory practicals. It is a relaxed, casual atmosphere where students interact with instructors in small group settings and discuss daily topics over lunch. As are Gatan’s scientists and customers, school participants are international, with broad microscopy backgrounds and skills. All schools are held at the main Gatan Research and Development facility in Pleasanton, California, USA.

These are popular schools and the limited spaces fill quickly. If you are interested in this unique educational offering, we recommend that you visit the Gatan website (www.gatan.com) in November 2005 for complete school program and on-line registration information. If you have any questions, please do not hesitate to contact your local Gatan Sales office (see www.gatan.com). We hope to see you in the Spring.

• TEM Digital Microscopy (April-May 2006, tba): This course introduces all levels of TEM users to digital microscopy using Gatan's CCD cameras and software imaging products. The course will explore the parameters necessary to optimize TEM image acquisition, processing, and analysis for biological and materials science applications with a view to replacement of conventional photographic recording film.

• EELS Imaging & Analysis (April-May 2006, tba): The purpose of this course is two-fold. On the one hand, it serves as an introduction to the capabilities of EFTEM and EELS for prospective users of Gatan energy filters (GIF™) and spectrometers (Enfina™). On the other hand, it also provides the necessary theoretical background and hands-on training that current users need to get the most out of their Gatan EFTEM and EELS instruments and software.

• TEM Specimen Preparation (April-May 2006, tba): An intensive course designed to instruct the art and science of TEM specimen preparation. The course concentrates on various ion milling techniques now available and demonstrates methods by which excellent TEM specimens can be produced from almost any material. Special attention will be given to the preparation of cross-sections through surfaces and interfaces.

• SEM Specimen Preparation (April-May 2006, tba): A course designed to teach a new method for preparing high-quality SEM and Light Microscopy specimens using an ion beam etching technique. This 2-day course is intended to offer users an alternative/replacement method to the traditional "wet" chemical etching technique used to decorate SEM samples.

• In-situ SPM-TEM Nanocharacterization (June-July 2006, tba): This course is focused on the introduction of SPM-TEM technique for characterization of nano-materials. It covers the basics of the SPM microscopy such as STM and AFM and in-situ Nanoindentation. It serves to provide the information and operational training for prospective customers and for those who already use SPM-TEM systems in their research.