Software Products

3D Tomography-Acquisition Software

Electron tomography has become a popular means to determine three dimensional structures on a range of scales in materials ranging from biological samples to those typical of the semiconductor industry. These diverse specimens, however, require a diverse number of techniques to best understand the material under study. Gatan now provides tomography acquisition software in DigitalMicrograph™ that makes it possible to collect a tomographic tilt series using TEM, STEM or EFTEM modes of operation.




TEM Tomography in DigitalMicrograph. Gatan's 3D Tomography Software collecting a tilt series from a sample of boron nanotubes. The three images on the top right show the focus tracking in progress, while the three images on the bottom right show the x,y tracking in progress. The large image on the left displays the collected tilt series. The palette on the top right shows the tomography control interface during acquisition.


Key Features

Whether you collect your data in TEM, STEM or EFTEM mode the software provides the following key features:

Tracking

Report Generation

2D Visualization

Data Access

Compatibility

TEM Tomography

The TEM Tomography software enables collection of data in TEM mode on any microscope equipped with the following computer controllable components: objective lens, image-shift deflectors, beam-shift deflectors, and a tilting stage. Drift corrections are performed by means of the objective lens and image-shift, beam-shift deflectors. Specific features are:

STEM Tomography

 The STEM Tomography software enables collection of data in STEM mode on a microscope equipped with the following computer controllable components: condenser lens and/or objective lens, and a tilting stage. The microscope must be equipped with a Gatan DigiScan scan generator (DigiScan I or DigScan II) and compatible STEM detector. Specific features are:

 

 

Click on the image above to play the movie. If you have a problem viewing these movies click here to download the BF movie (left) and here to download the HAADF movie (right).

Interplanetary dust particle. STEM tilt series acquired with a Gatan 805 BF/ADF detector and Gatan 806 HAADF detector from -61� to 68� by Dr. Ilke Arslan of Sandia National Laboratories, Livermore, California and Dr. John P. Bradley of Lawrence Livermore National Laboratory, Livermore, California.

EFTEM Tomography

The ETEM Tomography software enables collection of data from a microscope equipped with an energy filter. The filter can be either a Gatan Imaging Filter or certain JEOL or ZEISS in-column filters equipped with a Gatan CCD camera. The microscope must be equipped with the following computer controllable components: objective lens, image-shift deflectors, beam-shift deflectors, and a tilting stage. Specific features are:

 

Click on the image above to play the movie. If you have a problem viewing this movie click here to download a copy.

Carbon nanotubes containing iron catalyst particles with TiO2 powder. EFTEM tilt series acquired with a Gatan Tridiem energy filter from -50� to 50�. A plasmon series (5eV slit, 17.6eV energy), titanium L-23 series (30eV slit, 2 pre-edge, 1 post-edge), and iron L-23 series (40eV slit, 2 pre-edge, 1 post-edge) were collected. Elemental series for titanium (blue) and iron (red) were generated with Gatan's elemental mapping software and combined with the plasmon series (green).

 

 Product Requirements

 Product System Requirements  Suggested
Configuration 
TEM
Tomography 
  • DigitalMicrograph
  • Any Gatan CCD camera, including GIF camera
    • Any supported electron microscope1
      >200 GB free hard drive space
      EFTEM
      Tomography
      • DigitalMicrograph
      • Any GIF or any supported in-column filter2 equipped with a Gatan CCD camera
      •  Any supported electron microscope1
      >200 GB free hard drive space
      STEM
      Tomography
      • DigitalMicrograph
      • DigiScan I or II
      • One or more DigiScan compatible STEM detectors3
      >200 GB free hard drive space

      1 Supported Electron Microscopes include most recent JEOL, FEI, ZEISS TEM/STEM microscopes. Microscope must have computer controlled 4-axis stage control. Contact Gatan to confirm compatibility.
      2 Supported Energy Filters include all Gatan Imaging Filters, most JEOL and ZEISS in-column filters when equipped with a Gatan CCD camera. Contact Gatan to confirm compatibility.
      3 Supported DigiScan Compatible Detectors include the Gatan 805 BF/DF STEM detector and the Gatan 806 HAADF detector and others. Contact Gatan to confirm compatibility

      For complete product and ordering information, see the complete 3D Tomography Brochure or contact your local Sales office.