3View System

Automate sectioning and image capture of your 3D ultrastructure using serial block-face scanning electron microscopy.

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The 3View® system allows high throughput, high resolution imaging of a wide variety of samples in 3D. 32k x 24k image support and high performance stages allow fully automated high speed imaging of many different types of samples. 

  • Serial block face imaging minimizes errors and distortions found when using focus ion beam imaging or traditional serial section imaging
  • Large format image support (32k x 24k) allows very large images to be collected and minimizes the amount of time wasted waiting for stage motion when imaging very large regions
  • <50 nm X, Y stage repeatability allows multi-region imaging without losing data due to imprecise stage motion
  • 15 nm Z section thickness without the need to unblur multi-kV images
  • High performance back-scatter detector allows high speed imaging at low kV without giving up image quality


Journal of Neuroscience

Holcomb, P. S.; Hoffpauir, B. K.; Hoyson, M. C.; Jackson, D. R.; Deerinck, T. J.; Marrs, G. S.; Dehoff, M.; Wu, J.; Ellisman, M. H.; Spirou, G. A.


Eberle, A. L.; Selchow, O.; Thaler, M.; Zeidler, D.; Kirmse, R.

2014 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)

Schurch, R.; Rowland, S. M.; Bradley, R. S.; Hashimoto, T.; Thompson, G. E.; Withers, P. J.