3View System

Automate sectioning and image capture of your 3D ultrastructure using serial block-face scanning electron microscopy.

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The 3View® system allows high throughput, high resolution imaging of a wide variety of samples in 3D. 32k x 24k image support and high performance stages allow fully automated high speed imaging of many different types of samples. 

  • Serial block face imaging minimizes errors and distortions found when using focus ion beam imaging or traditional serial section imaging
  • Large format image support (32k x 24k) allows very large images to be collected and minimizes the amount of time wasted waiting for stage motion when imaging very large regions
  • <50 nm X, Y stage repeatability allows multi-region imaging without losing data due to imprecise stage motion
  • 15 nm Z section thickness without the need to unblur multi-kV images
  • High performance back-scatter detector allows high speed imaging at low kV without giving up image quality


Journal of Neuroscience

Holcomb, P. S.; Hoffpauir, B. K.; Hoyson, M. C.; Jackson, D. R.; Deerinck, T. J.; Marrs, G. S.; Dehoff, M.; Wu, J.; Ellisman, M. H.; Spirou, G. A.


Pollier, J.; Moses, T.; González-Guzmán, M.; De Geyter, N.; Lippens, S.; Bossche, R. V.; Marhavý, P.; Kremer, A.; Morreel, K.; Guérin, C. J.; Tava, A.; Oleszek, W.; Thevelein, J. M.; Campos, N.; Goormachtig, S.; Goossens, A.


Helmstaedter, M.; Briggman, K. L.; Turaga, S. C.; Jain, V.; Seung, H. S.; Denk, W.