646 Double Tilt Analytical Holder

The 646 Double Tilt Analytical Holder incorporates design features optimized for electron diffraction and EDX analysis of crystalline TEM specimens.  

Key Features

Low background design

• Beryllium specimen cradle, Hexring® and Anti-twist washer to gently and securely hold the specimen in place

ToggleTilt™ beta drive mechanism

• Robust operation with no mechanical binding of the specimen cradle at tilt limits

• Maximum +/- 30° using TEM control

• Maximum +/- 45° using Accutroller

Reduced Shadowing

• Optimized for EDX analysis

Integral Faraday Cage

• Quantitative measurement of the incident electron current  

Tilt ranges and compatibility of specimen holders vary according to the TEM manufacturer, model, pole piece gap, and the presence of in-gap accessories.  Please contact your local Gatan representative for more information.



ToggleTilt™ beta drive mechanism