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Precision Etching Coating System and Slope Cutter ToolLIBRARY1. New broad ion beam (BIB) processing steps for 3D SEM investigation of heterogeneous solids (W. Hauffe et al). Click here for a copy. 2. 3D Microscopy and Microanalysis of heterogeneous SEM samples by broad ion beam processing: cutting-etching-coating (W. Hauffe et al). Click here for a copy. 3. Advances in broad ion beam processing for 3D microscopy and microanalysis of ceramic composites (W. Hauffe et al). Click here for a copy. 4. 3D microscopy and microanalysis of Au-Al ultrasonic bonds by specific ion beam processing steps and scanning electron microscopy (W. Hauffe et al). Click here for a copy. 5. Ion beam preparation procedures for three-dimensional SEM resolved Kikuchi (EBSD) and Kossel microdiffraction analysis of deformed metals (W. Hauffe et al). Click here for a copy. 6. Broad ion beam grid cutting with Gatan PECS for 3D scanning electron microscopy
and microanalysis of integrated circuits and layered structures (W. Hauffe et
al). Click here for a copy.
12. Poster 1. Ion Beam Etching of Metal Composites using Gatan’s PECS
(I. Gräf). Click here
for a copy. For complete product information, please click here
to download a PDF of the Slope Cutter Tool Brochure or contact your local Sales
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