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  • Electron ptychography for atomic-scale defect analysis in two-dimensional materials
    New ptychography results!
    Using a Stela hybrid-pixel camera and STEMx system, this experiment resolves single-atom defects in monolayer MoS₂ and WS₂ while minimizing beam damage and revealing low‑Z atom displacement.
  • Gatan Insight Vol. 24 No. 1
    Now available - Gatan Insight!
    March issue includes: Understanding precipitate behavior in aluminum alloys, Custom scanning, and Revealing lithium alloy phases in indium solid state battery anodes.
  • Real-space mapping of deuterated polymers using dark-field EELS
    Real-space mapping of deuterated polymers using dark-field EELS
    Learn how dark-field vibrational EELS enables real-space, nanometer-scale mapping of hydrogen and deuterium in polymers, revealing molecular-level phase segregation that is inaccessible with conventional TEM or neutron scattering.
  • Energy filtered 4D STEM reveals short-range ordering motifs in semiconductors
    Improve your semiconductor analysis with 4D STEM
    Read our new experiment brief, "Energy filtered 4D STEM reveals short-range ordering motifs in semiconductors"
  • High electron energy loss spectroscopy at extended fine structure
    Unlock high-quality EXELFS insights
    Join Dr. Chen and Dr. Wang of KAUST’s IAC Core Lab as they share methods for high‑quality EXELFS in TEM in our upcoming webinar: High electron energy loss spectroscopy at extended fine structure
Electron ptychography for atomic-scale defect analysis in two-dimensional materials
New ptychography results!
Gatan Insight Vol. 24 No. 1
Now available - Gatan Insight!
Real-space mapping of deuterated polymers using dark-field EELS
Real-space mapping of deuterated polymers using dark-field EELS
Energy filtered 4D STEM reveals short-range ordering motifs in semiconductors
Improve your semiconductor analysis with 4D STEM
High electron energy loss spectroscopy at extended fine structure
Unlock high-quality EXELFS insights

Recent Publications

Phenomenological understanding of the contribution of bulk and grain boundary precipitates on strengthening in prolonged-aged Al-Zn-Mg-Cu aluminium alloys

Materials Today Advances
2025

Tai, C. L.; Chiu, Y. N.; Chen, C. J.; Lin, S. K.; Lin, H. C.; Misra, R. D. K.; Yang, Y. L.; Hsiao, C. N.; Tsao, C. S.; Chung, T. F.

Nondeterministic dynamics in the η-to-θ phase transition of alumina nanoparticles

Science
2025

Sakakibara, M.; Hanaya, M.; Nakamuro, T.; Nakamura, E.

Strain effects in SrHfO3 films grown by hybrid molecular beam epitaxy

ACS Applied Electronic Materials
2025

Gemperline, P. T.; Thind, A. S.; Tang, C.; Sterbinsky, G. E.; Kiefer, B.; Jin, W.; Klie, R. F.; Comes, R. B.

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media library

See the latest high-quality images, videos and webinars. View Media Library
  • Structure of the RNA-dependent RNA polymerase from COVID-19 virusStructure of the RNA-dependent RNA polymerase from COVID-19 virus View image
  • First 3.2 Å β-galactosidase structure solved by cryo-EMFirst 3.2 Å β-galactosidase structure solved by cryo-EM View image
  • Quantitative mapping of lithium in the scanning electron microscopeQuantitative mapping of lithium in the scanning electron microscope View image
  • Cathodoluminescence image of paint pigmentCathodoluminescence image of paint pigment View image
  • Zircaloy 2 prepared with the PECS II instrumentZircaloy 2 prepared with the PECS II instrument View image
  • First 3.4 Å TRPV1 structure solved by cryo-EMFirst 3.4 Å TRPV1 structure solved by cryo-EM View image
  • K2 camera helps identify first ~700 kDa protein structure with D7 symmetry at 3.3 Å resolution using cryo-EMFirst ~700 kDa protein structure with D7 symmetry identified at 3.3 Å resolution using cryo-EM View image
  • DPC maps of pyrochlore oxide specimenDPC maps of pyrochlore oxide specimen View image

NEWS

Gatan launches the EDAX Orbis II Micro-XRF system
August 04, 2025
Gatan launches the EDAX Elite T Ultra EDS system
October 29, 2024
Gatan introduces the Monarc Pro T system for cathodoluminescence imaging
July 24, 2023
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EVENTS

May
25
2026
Japanese Society of Microscopy (JSM) 2026
Japan
Aug
02
2026
Microscopy and Microanalysis (M&M) 2026
United States
Aug
31
2026
International Microscopy Congress (IMC21) 2026
United Kingdom
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