出版物

Multi-convergence-angle ptychography with simultaneous strong contrast and high resolution

arXiv

2024

Mao, W.; Zhang, W.; Huang, C.; Zhou, L.; Kim, J. S.; Gao, S.; Lei, Y.; Wu, X.; Hu, Y.; Pei, X.; Fang, W.; Liu, X.; Song, J.; Fan, C.; Nie, Y.; Kirkland, A. I.; Wang, P.

Disentangling multiple scattering with deep learning: application to strain mapping from electron diffraction patterns

arXiv

2022

Munshi, J.; Rakowski, A.; Savitzky, B. H.; Zeltmann, S. E.; Ciston, J.; Henderson, M.; Cholia, S.; Minor, A. M.; Chan, M. K. Y.; Ophus, C.

Atomic-number (Z)-correlated atomic sizes for deciphering electron microscopic molecular images

arXiv

2021

Xing, J.; Takeuchi, K.; Kamei, K.; Nakamuro, T.; Harano, K.; Nakamura, E.

Potential nanoscale sources of decoherence in niobium based transmon Qubit architectures

arXiv

2022

Murthy, A. A.; Das, P. M.; Ribet, S. M.; Kopas, C.; Lee, J.; Reagor, M. J.; Zhou, L.; Kramer, M. J.; Hersam, M. C.; Checchin, M.; Grassellino, A.; dos Reis, R.; Dravid, V. P.; Romanenko, A.

Electric-field control of chirality

arXiv

2021

Behera, P.; May, M. A.; Gómez-Ortiz, F.; Susarla, S.; Das, S.; Nelson, C. T.; Caretta, L.; Hsu, S. -L.; McCarter, M. R., Savitzky, B. H.; Barnard, E. S.; Raja, A.; Hong, Z.; García-Fernandez, P.; Lovesey, S. W.; van der Laan, G.; Ophus, C.; Martin, L. W.; Junquera, J.; Raschke, M. A.; Ramesh, R.

Plasma profiling time-of-flight mass spectrometry for fast elemental analysis of semiconductor structures with depth resolution in the nanometer range

arXiv.org

2019

Spende, H.; Margenfeld, C.; Meyer, T.; Clavero, I. M.; Bremers, H.; Hangleiter, A.; Seibt, M.; Waag, A.; Bakin, A.

3-D quantitative microanatomy of rat kidney podocytes as determined by serial block-face scanning electron microscopy

ASME 2012 Summer Bioengineering Conference

2012

Azeloglu, E.; Stothers, M.; Deerinck, T. J.; Falkenberg, C.; Chen, Y.; He, J. C.; Hone, J. C.; Leslie, L. M.; Ellisman, M. H.; Iyengar, R.

Effects of substrate and post‐deposition annealing on structural and optical properties of (ZnO)1−x(GaN)x films

Basic Solid State Physics

2019

Olsen, V. S.; Bazioti, C.; Baldissera, G.; Azarov, A.; Prytz, Ø.; Persson, C.; Svensson, B. G.; Kuznetsov, A. Y.; Vines, L.

Formation of pure Cu nanocrystals upon post-growth annealing of Cu–C material obtained from focused electron beam induced deposition: comparison of different methods

Beilstein Journal of Nanotechnology

2015

Szkudlarek, A.; Vaz, A. R.; Zhang, Y.; Rudkowski, A.; Kapusta, C.; Erni, R.; Moshkalev, S.; Utke, I.

Scanning transmission helium ion microscopy on carbon nanomembranes

Beilstein Journal of Nanotechnology

2021

Emmrich, D.; Wolff, A.; Meyerbröker, N.; Lindner, J. K. N.; Beyer, A.; Gölzhäuser, A.

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