出版物

21 - 30 of 1218 publications
CSV

Optimized Ar+-ion milling procedure for TEM cross-section sample preparation

Ultramicroscopy
2011

Dieterle, L.;Butz, B.; Müller, E.

Development of a focused ion beam (FIB) technique to minimize X-ray fluorescence during energy dispersive X-ray spectroscopy (EDS) of FIB specimens in the transmission electron microscope (TEM)

Ultramicroscopy
1999

Longo, D. M.; Howe, J. M.; Johnson, W. C.

Assessment of the strain depth sensitivity of Moiré sampling scanning transmission electron microscopy geometrical phase analysis through a comparison with dark-field electron holography

Ultramicroscopy
2021

Pofelski, A.; Whabi, V.; Ghanad-Tavakoli, S.; Botton, G.

Automated CBED processing: Sample thickness estimation based on analysis of zone-axis CBED pattern

Ultramicroscopy
2014

Klinger, M.; Němec, M.; Polívka, L.; Gärtnerová, V.; Jäger, A.

Optimising electronholography in the presence of partial coherence and instrument instabilities

Ultramicroscopy
2015

Chang, S. L.; Dwyer, C.; Boothroyd, C. B.; Dunin-Borkowski, R. E.

Low voltage EELS - How low?

Ultramicroscopy
2014

Stöger-Pollach, M.

Coupled broad ion beam-scanning electron microscopy (BIB-SEM) for polishing and three dimensional (3D) serial section tomography (SST)

Ultramicroscopy
2020

Gholinia, A.; Curd, M. E.; Bousser, E.; Taylor, K.; Hosman, T.; Coyle, S.; Hassel Shearer, M.; Hunt, J.; Withers, P. J.

Experimental method for determining Cliff–Lorimer factors in transmission electron microscopy (TEM) utilizing stepped wedge-shaped specimens prepared by focused ion beam (FIB) thinning

Ultramicroscopy
1999

Longo, D. M.; Howe, J. M.; Johnson, W. C.

Precise measurement of the electron beam current in a TEM

Ultramicroscopy
2021

Krause, F. F.; Schowalter, M.; Oppermann, O.; Marquardt, D.; Müller-Caspary, K.; Ritz, R.; Simson, M.; Ryll, H.; Huth, M.; Soltau, H.; Rosenauer, A.

Diffraction contrast imaging using virtual apertures

Ultramicroscopy
2015

Gammer, C.; Ozdol, V. B.; Liebscher, C. H.; Minor, A. M.

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