31 - 40 of 1216 publications
Mapping titanium and tin oxide phases using EELS: An application of independent component analysis
Ultramicroscopy
2011
Optimizing disk registration algorithms for nanobeam electron diffraction strain mapping
Ultramicroscopy
2017
Coupled broad ion beam-scanning electron microscopy (BIB-SEM) for polishing and three dimensional (3D) serial section tomography (SST)
Ultramicroscopy
2020
On the benefit of aberration-corrected HAADF-STEM for strain determination and its application to tailoring ferroelectric domain patterns
Ultramicroscopy
2015