出版物

31 - 40 of 1218 publications
CSV

On the benefit of aberration-corrected HAADF-STEM for strain determination and its application to tailoring ferroelectric domain patterns

Ultramicroscopy
2015

Tang, Y. L.; Zhu, Y. L.; Ma, X. L.

Characterization of surface metallic states in SrTiO3 by means of aberration corrected electron microscopy

Ultramicroscopy
2013

Sánchez-Santolino, G.; Tornos, J.; Bruno, F. Y.; Cuellar, F. A.; Leon, C.; Santamaría, J.; Pennycook, S. J.; Varela, M.

Assessment of the strain depth sensitivity of Moiré sampling scanning transmission electron microscopy geometrical phase analysis through a comparison with dark-field electron holography

Ultramicroscopy
2021

Pofelski, A.; Whabi, V.; Ghanad-Tavakoli, S.; Botton, G.

CTER-rapid estimation of CTF parameters with error assessment

Ultramicroscopy
2014

Penczek, P. A.; Fang, J.; Li, X.; Cheng, Y.; Loerke, J.; Spahn, C. M. T.

Development of a focused ion beam (FIB) technique to minimize X-ray fluorescence during energy dispersive X-ray spectroscopy (EDS) of FIB specimens in the transmission electron microscope (TEM)

Ultramicroscopy
1999

Longo, D. M.; Howe, J. M.; Johnson, W. C.

Practical aspects of diffractive imaging using an atomic-scale coherent electron probe

Ultramicroscopy
2016

Chen, Z.; Weyland, M.; Ercius, P.; Ciston, J.; Zheng, C.; Fuhrer, M. S.; D'Alfonso. A. J.; Allen, L. J.; Findlay, S. D.

Four-dimensional STEM-EELS: Enabling nano-scale chemical tomography

Ultramicroscopy
2009

Jarausch, K.; Thomas, P.; Leonard, D. N.; Twesten, R.; Booth, C. R.

Aberration-corrected transmission electron microscopy analyses of GaAs/Si interfaces in wafer-bonded multi-junction solar cells

Ultramicroscopy
2013

Häussler, D.; Houben, L.; Essig, S.; Kurttepeli, M.; Dimroth, F.; Dunin-Borkowski, R. E.

Coupled broad ion beam-scanning electron microscopy (BIB-SEM) for polishing and three dimensional (3D) serial section tomography (SST)

Ultramicroscopy
2020

Gholinia, A.; Curd, M. E.; Bousser, E.; Taylor, K.; Hosman, T.; Coyle, S.; Hassel Shearer, M.; Hunt, J.; Withers, P. J.

Precise measurement of the electron beam current in a TEM

Ultramicroscopy
2021

Krause, F. F.; Schowalter, M.; Oppermann, O.; Marquardt, D.; Müller-Caspary, K.; Ritz, R.; Simson, M.; Ryll, H.; Huth, M.; Soltau, H.; Rosenauer, A.

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