2020 MRS Spring Meeting & Exhibit
Are you facing challenges characterizing your samples with your current TEM or SEM instruments and software?
Visit the Gatan booth at MRS Spring 2020 and discover solutions to preparing, imaging, and analyzing delicate, complex materials for all electron microscopy applications. Our industry-leading instruments and software are used by researchers worldwide in a broad range of TEM and SEM applications and techniques:
- Direct detection imaging of beam-sensitive materials
- Electron energy loss spectroscopy
- In-situ EM
- Sample preparation for microstructure characterization and failure analysis
Our team of R&D engineers and sales managers will be available to discuss your application needs. If you prefer, please contact Mike Coy to schedule an appointment. See how we can help you acquire your best results.