3View Users Forum at EMBL 2016
We invite you to join the 3View User Forum hosted by the EMBL to discuss the latest methods, techniques and development in serial block-face scanning electron microscopy (SBEM, SBSEM, SBFSEM). This event is a satellite meeting that will be held following the “From 3D Light to 3D Electron Microscopy” EMBL workshop and will feature:
- Presentations by international SBEM thought leaders
- Networking session to exchange best practices and emerging applications
Register soon as seats are limited.
Call for Speakers
Applications for an oral or poster presentation are now closed. Thank you for your submissions.