Advanced Direct Detection EELS Workshop 2019 at the Institute of Materials France
The Advanced Direct Detection EELS Workshop at the Institut des Matériaux Jean Rouxel of Nantes (IMN) provides experienced EELS users a comprehensive training program with presentations on direct detection technology for low dose imaging and EELS data acquisition and extensive hands-on demonstrations on IMN's premiere direct detection EELS systems. Live microscope sessions will utilize a state-of-the-art TEM with a monochromator and probe corrector and a GIF Quantum® K2 System.
Workshop topics include:
- Direct detection technology
- Counting electrons and advantages for imaging and EELS spectroscopy
- Noise-free EELS analysis
- Fast STEM EELS analysis
- Low-dose EELS analysis
- Chemical analysis
- Ultra-high energy edges acquisition
- Direct detection practical sessions: If you are interested in bringing your own specimen, please contact Danielle Monville or Vincent Richard beforehand.
Space is limited. We encourage you to register now. For complete workshop information and to register for this event, please contact Danielle Monville or Vincent Richard of Gatan France. We hope you see you at IMN.