Advanced EM School on Aberration-Corrected Microscopy and EELS
This training school organized by the Canadian Centre for Electron Microscopy will focus on advanced training with instructors and expert users of aberration-corrected microscopes, electron optics (correctors and microscopes) and spectrometers. The school will cover advanced electron energy loss spectroscopy (EELS) acquisition methods on the GIF Quantum®, Tridiem® and FS1 spectrometers, monochromator alignments, advanced EELS data processing, multivariate statistical methods, advanced STEM image data processing and energy loss near-edge structures (ELNES) computation methods. This school boast very satisfied high-level students and, also very importantly, very pleased supervisors for the quality of the interactions and learning directly with experts in the operation and alignments of the microscopes.