AMAS XIII: 13th Biennial Australian Microbeam Analysis Symposium
The aim of the symposium is to provide a forum to discuss and share ideas on advances, trends and challenges in microanalysis and imaging, with an emphasis on practical solutions and applications. We invite you to present your research on technological developments and applications in a wide range of microanalysis techniques, such as:
- Scanning and transmission electron microscopy (SEM, TEM), including variable pressure (VP), cathodoluminescence (CL), electron backscatter diffraction (EBSD), focussed ion beam (FIB), electron energy loss spectroscopy (EELS), cryo, and nanofabrication methods.
- X-ray microanalysis using energy or wavelength dispersive x-ray spectrometers (EDS, WDS) on instruments with electron beams (SEM, TEM), x-ray beams (uXRF, synchrotron XRF), or proton beams (PIXE).
- Beam methods employing mass spectrometers, such as secondary ion mass spectrometry (SIMS), and laser ablation inductively coupled mass spectrometry (LA-ICP-MS), also including laser induced breakdown spectroscopy (LIBS).
- Vibrational microspectroscopy, such as micro Fourier transform infra-red (FTIR) spectroscopy and micro-Raman spectroscopy, including tip-enhanced Raman spectroscopy (TERS)
- Other spatially resolved analysis and imaging techniques like atom probe tomography (APT), atom force and scanning tunneling microscopy (AFM, STM), or x-ray tomography (uCT)
Gatan is a corporate sponsor of AMAX XIII.