European EELS & EFTEM School 2018
Problem Solving with TEM
The joint FELMI and Gatan EELS and EFTEM School is an intense, hands-on laboratory-based program that will take participants step-by-step through the acquisition and analysis of Energy Filtered TEM (EFTEM) and STEM-EELS (Scanning Transmission Electron Microscope - Electron Energy Loss Spectroscopy) data. The school will utilize the state-of-the-art facilities and faculty of EELS experts at FELMI-ZFE. The featured microscope system will use a monochromated probe-corrected (S)TEM with a Gatan DualEELS system.
FELMI and Gatan EELS experts will train participants in the latest EELS and EFTEM instruments and software, including the Gatan Imaging Filter (GIF), as well as present and demonstrate fundamental principles and methods essential to acquire optimal EELS spectra, STEM-EELS spectrum images, energy-filtered images, and elemental maps. Optimization of the source monochromator for high-resolution EELS and the Cs probe corrector for STEM-EELS will also be presented.
Participants will learn practical EELS and EFTEM techniques for both materials and life sciences, hardware and software systems, and advanced applications. Prior experience with transmission electron microscopy in the conventional and scanning (STEM) mode is beneficial; a basic familiarity with EELS and EFTEM is also encouraged.
The daily schedule will include lectures, discussions with the instructors, and hands-on, live microscope sessions. The ultimate goal is to provide participants with the training and knowledge needed to acquire their best EELS and EFTEM results.
Seating is limited. We encourage you to register now. If you have any questions, please contact Dr. Gerald Kothleitner, Graz University.