International Conference on Defects-Recognition, Imaging and Physics in Semiconductors 2019
The International Conference on Defects-Recognition, Imaging, and Physics in Semiconductors (DRIP XVIII) focuses on all aspects of defects in semiconductors including point, line, planar and volume defects studied by a variety of tools. Most recent advances in the field of defect analysis will be discussed. This comprehensive approach has allowed for a discussion of the multifaceted effects of growth, processing, device fabrication as well as their interrelationships, and how to approach the study of defects. The conference provides an outstanding international forum to present and discuss the correlation between crystal defects, device fabrication, and degradation.
Gatan is a corporate sponsor and exhibitor of DRIP XVIII. Please visit the Gatan exhibit table. We will have a team of R&D engineers and sales managers to provide solutions to your TEM and SEM application needs. We invite you to attend the Gatan presentation: Monarc: Redefining what’s possible in cathodoluminescence microscopy (18:15-18:25; 10 September). If you prefer, please contact Dr. Merlin Mueller of Gatan GmbH to make an appointment to meet during the conference. We look forward to seeing you at DRIP XVIII.