International Symposium for Testing and Failure Analysis 2019 Meeting
Are you facing challenges preparing, imaging, and analyzing your FA samples with your current TEM or SEM instruments and software?
Please visit the Gatan booth at the International Symposium for Testing and Failure Analysis (ISTFA) 2019 Meeting. We design and manufacture instruments and products for advanced microelectronics testing and analysis in electron microscopy. Our products are used in a broad range of failure analysis applications, including those for semiconductors (micro- and nano-electronics), nano-materials, and optoelectronic devices.
We will have a team of R&D engineers and sales managers to discuss your FA challenges and provide solutions with our broad range of FA-specific instruments and software. If you prefer, please contact Matt Chipman to schedule an onsite meeting. We hope to see you in Portland.