International Symposium for Testing and Failure Analysis 2021

Are you facing challenges preparing, imaging, and analyzing your SiP, semiconductor, and electronic samples?

Please visit the Gatan/EDAX booth (704) at ISTFA 2021. We design and manufacture instruments and products for advanced microelectronics testing and analysis for TEM and SEM. Our industry-leading instruments and software are used in a broad range of failure analysis applications, including those for semiconductors (micro- and nano-electronics), nano-materials, and optoelectronic devices.

We will have a team of R&D engineers and sales managers to discuss your FA challenges and provide solutions with our broad range of FA-specific instruments and software. If you prefer, please contact John Haritos to schedule an onsite meeting. We hope to see you in Phoenix.

Gatan Device Analysis       EDAX EBSD

Sunday, October 31, 2021 to Thursday, November 4, 2021
8:00 am - 5:00 pm
Phoenix Convention Center
100 North Third Street
85004 Phoenix , AZ
United States
Arizona US