International Symposium for Testing and Failure Analysis 2021
Are you facing challenges preparing, imaging, and analyzing your SiP, semiconductor, and electronic samples?
Please visit the Gatan/EDAX booth (704) at ISTFA 2021. We design and manufacture instruments and products for advanced microelectronics testing and analysis for TEM and SEM. Our industry-leading instruments and software are used in a broad range of failure analysis applications, including those for semiconductors (micro- and nano-electronics), nano-materials, and optoelectronic devices.
We will have a team of R&D engineers and sales managers to discuss your FA challenges and provide solutions with our broad range of FA-specific instruments and software. If you prefer, please contact John Haritos to schedule an onsite meeting. We hope to see you in Phoenix.