Live Virtual Workshop: Stela Hybrid-Pixel Electron Detector for 4D STEM Diffraction
Gatan invites you to attend this unique workshop demonstrating the application of the Stela™ hybrid-pixel electron detector in four-dimensional scanning transmission electron microscopy (4D STEM).
Stela employs electron counting to minimize noise and uses on-the-fly digitization for the highest dynamic range. These, in addition to its fast frame rate and optimized performance at low kV, make it the best electron diffraction detector for advanced materials characterization studies. Moreover, the Stela camera is the only fully integrated hybrid-pixel electron detector with the Gatan Microscopy Suite® software. This integration allows for seamless, optimized, and high-quality 4D STEM data acquisition and streamlined workflows for data processing, resulting in the shortest time to results.
This comprehensive workshop will feature presentations, a live microscope demonstration (including 4D STEM data acquisition and processing), and an open Q&A session. The microscope session will be performed on a STEM system equipped with a Stela hybrid-pixel electron detector and a STEMx® 4D STEM diffraction system.
This workshop is complimentary to all registered.
Presenter: Dr. Ana Pakzad, Product Manager – Diffraction, Gatan.