Microscopy and Microanalysis 2021

"Due to ongoing health concerns related to the coronavirus that causes COVID-19, availability of the COVID-19 vaccine, global and organizational travel restrictions, and additional concerns shared by the microscopy and microanalysis community in recent surveys, MSA and MAS have decided to cancel the in-person meeting originally scheduled for August 1 – 5, 2021 in Pittsburgh, Pennsylvania, USA. For the health, safety, and well-being of the entire community, we will convert the Microscopy and Microanalysis (M&M) 2021 Meeting content into a virtual (completely online) meeting in its place."

Gatan continues as a major sponsor and exhibitor of M&M and MSA/MAS. We invite you to our live and on-demand sessions to learn how our industry-leading instruments and software can help you achieve your best results.


Reserve time to experience how our best-in-class TEM and SEM systems are setting new benchmarks for materials and life science research.

GIF Continuum
Next-generation of advanced systems for EELS & EFTEM.
Empowers the most complete cathodoluminescence analysis to date.
High-sensitivity, large-pixel count of detector optimal for in-situ studies.
Stela with 4D STEM
Only fully integrated hybrid-pixel electron detector for advanced electron diffraction.
The new standard for the collection of cryo-EM and MicroED datasets.



Your ultimate system? See how our new analytical systems for advanced TEM and STEM applications can empower your research.

BioContinuum HD
Extends the best-in-class cryo-EM and cryo-ET imaging you expect to the EELS and EFTEM applications that you want…no compromise.
Latitude D
Delivers the efficiency and high-throughput data collection that you expect from Latitude to MicroED studies.

GIF Continuum K3 System
Electron counting for all EELS, EFTEM, and energy-filtered 4D STEM applications.

EDAX EDS Powered by Gatan
The most intuitive and easy-to-use analytical tool for (scanning) transmission electron microscope (STEM) applications


Learn how Gatan technology can deliver new approaches to advance your research. We invite you to attend our Exhibitor Spotlight, Vendor Tutorials, and technical sessions. After each live/streaming session, MSA will post the on-demand recording in the Scientific Program. The schedule below is shown in Eastern Daylight Time (EDT USA).

Monday, August 2  
12:30 – 1:30 p.m. Real World Application of EBSD Forward Models
(Presentation 15; Session A03.1)
William Lenthe
2:30 – 3:30 p.m.
Low Dose EBSD Analysis of Biominerals
(Presentation 95; Session A12.2)
Rene de Kloe
2:30 – 3:30 p.m. Optimizing Throughput for Cryo-EM Data Collection in Drug Discovery
(Presentation 102; Session B05.2)
Stephen Mick
4:15 – 5:45 p.m. In-Situ Spectrum Imaging with Synchronized and Automated Stimulus Control
(Presentation 207; Session P01.P1)
Liam Spillane
Tuesday, August 3  
12:30 – 1:30 p.m. Abilities Towards Improved Accuracy in EPMA
(Presentation 358; Session A10.1)
Frank Eggert
12:30 – 1:30 p.m.
Evaporation-Field Differences with Deep-UV Atom Probe Tomography
(Presentation 415; Session P13.4)
Ty Prosa
12:30 – 1:30 p.m. Leveraging Hybrid Pixel Electron Detection Technology to Expand Electron Microscopy Observation of Material Structures at Low Voltages
(Presentation 321; Session A01.4)
Anahita Pakzad
12:30 – 1:30 p.m. Strategies for Multimodal Analysis of Joint EELS and EDS Data
(Presentation 346; Session A07.1)
Ray Twesten
2:30 – 3:00 p.m. Advantages of Electron Counting Detectors for EELS and EFTEM Acquisition
Exhibitor Spotlight
Liam Spillane, Ray Twesten
3:00 – 4:00 p.m. Using py4DSTEM in GMS: Hybrid Open-Source, Commercial-Freeware Methods for Analyzing 4D STEM Datasets
(Presentation 446; Session A08.2)
Benjamin Miller
5:15 – 6:45 p.m. EDS Quantification Using Fe L Peaks and Low Beam Energy
(Presentation 557; Session A10.P1)
Jens Rafaelsen
5:15 – 6:45 p.m. Mitigating Shadowing and Topographic Artifacts Using Dual EDS Detectors
(Presentation 523; Session A03.P1)
Shangshang Mu
5:15 – 6:45 p.m. The Detector Efficiency Question with EDS
(Presentation 558; Session A10.P1)
Frank Eggert
6:45 – 7:45 p.m. Developing a Comprehensive In-Situ Workflow for TEM Experiments
Vendor Tutorial
Cory Czarnik, Benjamin Miller
Wednesday, August 4
2:15 – 3:15 p.m.
Challenges in Atom Probe Tomography Instrumentation and Reconstruction
(Presentation 683; Session A07.4)
David Reinhard
2:15 – 3:15 p.m. Safe and Quantitative Analysis of Nuclear Materials From the Milli to Nano-Scale
(Presentation 681; Session A07.4)
Robert Ulfig
4:30 – 6:00 p.m. Directions in Atom Probe Tomography
(Presentation 824; Session P13.P1)
David Larson
4:30 – 6:00 p.m. Electrostatic Reconstruction Technology in Atom Probe Tomography
(Presentation 829; Session P13.P1)
Brian Geiser
4:30 – 6:00 p.m. Matrix Composition and Fine-scale Structure Analysis of NMC Li-ion Battery Using Atom Probe Tomography
(Presentation 827; Session P13.P1)
Yimeng Chen
6:00 – 7:00 p.m. 4D STEM Diffraction Imaging: An Introduction to Data Acquisition and Processing
Vendor Tutorial
Ana Pakzad
Thursday, August 5
10:00 – 11:00 a.m.  Live Mapping of Crystalline Regions During In-Situ Heating (TEM and STEM)
(Presentation 893; Session P10.8)
Benjamin Miller
10:00 – 11:00 a.m.  Radiolysis Characterization in Liquid Cell STEM Using Ultra Low-Dose Electron Energy-Loss Spectroscopy
(Presentation 875; Session P03.2)
Liam Spillane
4:15 – 5:45 p.m.  Applications of Direct Electron Detection to the EBSD Analysis of Energy Conversion and Storage Materials
(Presentation 1124; Session P12.P2)
Matthew Nowell


Visit our sister company, EDAX, to learn how their elemental and structural microanalysis solutions can bring new insight to enhance your materials characterization.


Please get in touch with us to schedule a private chat, video meeting, or remote demonstration. We look forward to "meeting" you at M&M 2021. Good luck with your research.

Sunday, August 1, 2021 to Thursday, August 5, 2021
8:00 am - 6:00 pm
Virtual Event
United States