PICO 2021: Sixth Conference on Frontiers of Aberration Corrected Electron Microscopy
As with previous PICO meetings, PICO 2021 - Sixth Conference on Frontiers of Aberration Corrected Electron Microscopy (virtual) will again bring together an international audience of investigators to address recent advances in methods and applications for the study of solids in condensed matter research and the life sciences by the application of advanced electron microscopy techniques.
Gatan continues its sponsorship of the series of PICO conferences. We invite you to attend the Gatan presentation on the premiere TEM imaging systems for advanced 4D STEM and EELS/EFTEM studies:
- Recent advances for 4D STEM and EELS data acquisition: Stela and K3 (Dr. Ray Twesten, Gatan)
Please contact Dr. Merlin Mueller to chat about your applications and any issues you are facing. Dr. Mueller can also reserve a remote demonstration on our industry-leading TEM and SEM technology that can help you resolve your specific issues and help you achieve your best results. We look forward to meeting you at PICO 2021.