Stanford imaging workshop: Advanced applications of high speed imaging in S/TEM
Stanford Nano Shared Facilities (SNSF) and Gatan, Inc. invite you to attend this unique S/TEM workshop demonstrating the latest high speed imaging technology and applications specifically for in-situ TEM and 4D STEM diffraction.
This comprehensive, full-day workshop will feature lectures by leading experts, open Q&A sessions, and live microscope demonstrations all in the state-of-the-art SNSF research complex. The microscope sessions will be performed on an aberration (image) corrected, monochromated FEI Titan environmental (S)TEM with a Gatan OneView in-situ camera (winner of the 2015 Microscopy Today Innovation Award at M&M 2015).
This workshop is complimentary to all registered and confirmed participants and includes breakfast, lunch and refreshments. Seating is limited.
|8:30 – 9:00 a.m.||Registration (sign-in required) and breakfast|
|9:00 – 9:15 a.m.||Introduction to SNSF and workshop overview
Dr. Tobi Beetz, Stanford University and Dr. Ana Pakzad, Gatan
|9:15 – 10:00 a.m.||
Digital imaging in TEM
|10:00 – 10:45 a.m.||
In-situ TEM techniques
|10:45 – 11:00 a.m.||Break|
|11:00 a.m. – 12:30 p.m.||
Lab: In-situ TEM using high speed camera
|12:30 – 1:30 p.m.||Lunch|
|1:30 – 2:15 p.m.||Electron diffraction in S/TEM
Dr. Ann Marshall, Stanford University
|2:15 – 3:00 p.m.||Applications of high speed direct electron detectors in 4D STEM experiments including strain mapping, diffraction imaging, PACBED and phase contrast STEM
Dr. Colin Ophus, NCEM
|3:00 – 3:15 p.m.||Break|
|3:15 – 4:45 p.m.||Lab: 4D STEM diffraction using high speed camera|
|4:45 – 5:00 p.m.||Open forum and closing remarks|