Utilization of low voltage electron diffraction at high speed to solve practical materials problems
When electrons are accelerated at lower voltages than the typically used in transmission electron microscopy experiments (≤80 keV), the strong electron-matter interaction gives high scattering contrast and significantly reduces knock-on damage for many ceramics, semiconductors, minerals, and ordered carbonaceous material. In such materials, three-dimensional crystallography and its evolution can also be revealed. However, lowering the acceleration voltage can irreparably damage several organic materials due to their large cross-section for ionization or radiolysis.
This webinar will show examples of low-voltage, high-speed electron diffraction experiments using the Gatan Stela, a detector with a high-dynamic range, based on DECTRIS' fast hybrid-pixel technology, to study subtle structural changes and damage mechanisms that impact material properties.
Roberto dos Reis, Ph.D.
The NUANCE Center