Webinar - Applications of Direct Detectors in Materials Science
Technological advances in electron detectors are transforming the way we look at materials using transmission electron microscopy. Specifically, the revolution in direct detection electron counting cameras has enabled imaging modes that had only been theorized before, and this is allowing us to access a plethora of information from a variety of materials. By replacing the analog signal from each primary electron with a discrete count, the direct detectors have dramatically lifted the DQE of the camera across all spatial frequencies. As a consequence, the number of electrons in the electron beam can be reduced and used to illuminate a range of radiation-sensitive materials, e.g., soft/hard hybrid materials. The high speed and efficiency of direct detectors, in combination with the widespread availability of computational power, have also enabled the acquisition of large-scale four-dimensional (4D) STEM datasets, providing a multitude of information in one experiment.
In this webinar, we will cover many examples of usage of direct detection cameras at Northwestern University, from the imaging of soft materials to special applications of 4D-STEM in hybrid interfaces. In particular, we will cover the performance of the new Gatan K3 IS, which allows the acquisition of in-situ imaging and 4D STEM data in counted mode with high temporal resolution.
Roberto dos Reis, Ph.D.
Department of Materials Science and Engineering, Northwestern University